/ UiT Norges arktiske universitet
 

Johansen, Jarle André


Førsteamanuensis
Institutt for ingeniørvitenskap og sikkerhet


Telefon: 776 60366
Mobil jobb / Mobil privat: /
Epost : jarle.johansen@uit.no
Kontor/besøksadresse : Teknologibygget / 04-011
Funksjon : Førsteamanuensis

Stillingsbeskrivelse:

Førsteamanuensis ved ingeniørstudiet i automasjon ved Institutt for ingeniørvitenskap og sikkerhet.

Arbeider i CRIStin

  • Hansen, Bernt Inge; Johansen, Jarle André. Experimental results on the pressure dependence of the minnaert resonance frequency for nitrogen gas bubbles in water. Proceedings - IEEE Ultrasonics Symposium 2011. ISSN 1948-5719.s 2053 - 2056.s doi: 10.1109/ULTSYM.2011.0509.
  • Jin, Zhenrong; Johansen, Jarle Andre; Cressler, John D.; Reed, Robert A.; Marshall, Paul W.; Joseph, Alvin J.. Using proton irradiation to probe the origins of low-frequency noise variations in SiGeHBTs. IEEE Transactions on Nuclear Science 2004; Volum 50 (6). ISSN 0018-9499.s 1816 - 1820.
  • Johansen, Jarle Andre; Jin, Zhenrong; Cressler, John D.; Cui, Y; Niu, G; Liang, Q; Rieh, JS; Freeman, G; Ahlgren, D; Joseph, A. On the Scaling Limits of Low-Frequency Noise in SiGe HBTs. Solid-State Electronics 2004; Volum 48 (10-11). ISSN 0038-1101.s 1897 - 1900.
  • Johansen, Jarle Andre; Jin, Zhenrong; Cressler, John D.; Cui, Y; Niu, G; Liang, Q; Rieh, JS; Freeman, G; Ahlgren, D; Joseph, A. On the scaling limits of low-frequency noise in SiGe HBTs. Solid-State Electronics 2004; Volum 48 (10-11). ISSN 0038-1101.s 1897 - 1900.s doi: 10.1016/j.sse.2004.05.032.
  • Chen, Xuyuan; Johansen, Jarle Andre; Salm, Cora; Van Rheenen, Arthur D.. On low-frequency noise of polycrystalline GeSi for sub-micron CMOS technologies. Solid-State Electronics 2001; Volum 45. ISSN 0038-1101.s 1967 - 1971.
  • Chen, Xuyuan; Johansen, Jarle Andre; Van Rheenen, Arthur D.; Salm, Cora. On the 1/f noise of polycrystalline GexSi1-x for sub-micron CMOS technologies”. Solid-State Electronics 2000. ISSN 0038-1101.
  • Hansen, Bernt Inge; Johansen, Jarle André. Experimental results on the pressure dependence of the minnaert resonance frequency for nitrogen gas bubbles in water. Ultrasonics Symposium (IUS), 2011 IEEE International 2011-10-18 - 2011-10-21 2011.
  • Johansen, Jarle Andre; Qi, Peng. Model-Based Low-Frequency Noise Power Spectrum Density Fitting in SiGe HBTs. 7th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF 2007) (omtale) 2007-01-10 - 2007-01-12 2007.
  • Johansen, Jarle Andre. Lavfrekevnt støy i Silisium-Germanium transistorer. Studiemøtet Elektronikk og Data 2004-06-17 - 2004-06-18 2004.
  • Birkelund, Yngve; Johansen, Jarle Andre; Hanssen, Alfred. High-precision surrogate data based tests for Gaussianity and linearity of discrete time random processes. XII European Signal Processing Conference (EUSIPCO) 2004-10-06 - 2004-10-09 2004.
  • Johansen, Jarle Andre; Birkelund, Yngve; Jin, Zhenrong; Cressler, John D.. A Statistical Tool For Probing the Coupling Between Noisy Traps in Semiconductor Devices, With Application to 1/f Noise in SiGe HBTs. The 5'th topical meeting on Silicon Monolithic Integrated Circuits in RF Systems 2004-10-08 - 2004-10-10 2004.
  • Birkelund, Yngve; Hanssen, Alfred; Johansen, Jarle Andre. High-precision surrogate based tests for gaussianity and linearity. XII European Signal Processing Conference (EUSIPCO) 2004-09-06 - 2004-09-06 2004.
  • Johansen, Jarle Andre. Low-frequency Noise Characterization of Silicon-Germanium Resistors and Devices. 2004.
  • Birkelund, Yngve; Johansen, Jarle Andre; Cressler, John D.; Jin, Zhenrong. A statistical tool for probing the coupling between noisytraps in semiconductor devices, with application to 1/f noise in SiGe HBTs. Topical Meeting on Silicon Monolitic Integrated Circuits in RF Systems (SiRF) 2004-09-08 - 2004-09-08 2004.
  • Birkelund, Yngve; Johansen, Jarle Andre; Hanssen, Alfred; Cressler, John D.; Van Rheenen, Arthur D.. Time Series Analysis of Low-Frequency Noise in SiGe HBTs. NORSK SYMPOSIUM I SIGNALBEHANDLING 2003 2003-10-02 - 2003-10-04 2003.
  • Birkelund, Yngve; Hanssen, Alfred; Johansen, Jarle Andre; van Rheenen, Arthur D.; Cressler, John D.. Time series analysis of low-frequency noise in SiGe HBTs. Norsk symposium i signalbehandling 2003. 2003-10-02 - 2003-10-04 2003.
  • Zhu, Chendong; Liang, Qingqing; Al-Huq, Ragad; Cressler, John D.; Joseph, Alvin J.; Johansen, Jarle Andre; Chen, Tianbing; Niu, Guofu; Freeman, Greg; Rieh, Jae-Sung; Ahlgren, David. An Investigation of the Damage Mechanism in Impact Ionization-Induced "Mixed-Mode" Reliability Stressing of Scaled SiGe HBTs. IEEE International Electron Devices Meeting 2003 2003-12-08 - 2003-12-10 2003.
  • Johansen, Jarle Andre; Jin, Zhenrong; Cressler, John D.; Cui, Yan; Niu, Guofu; Liang, Qingqing; Rieh, Jae-Sung; Freeman, Greg; Ahlgren, David; Joseph, Alvin J.. On the Scaling Limits of Low-Frequency Noise in SiGe HBTs. 2003 International Semiconductor Device Research Synopsium 2003-12-10 - 2003-12-12 2003.
  • Jin, Zhenrong; Johansen, Jarle Andre; Cressler, John D.; Reed, Robert A.; Marshall, Paul W.; Joseph, Alvin J.. Using Proton Irradiation to Probe the Origins of Low-frequency Noise Variations in SiGe HBTs. 2003 IEEE Nuclear and Space Radiation Effects Conference 2003-07-21 - 2003-07-25 2003.
  • Johansen, Jarle Andre; Jin, Zhenrong; Cressler, John D.; Joseph, Alvin J.. Geometry-Dependent Low-frequency Noise Variations in 120 GHz fT SiGe HBTs. IV. Topical Meeting on Silicon Monlithic Integrated Circuits in RF Systems 2003-04-09 - 2003-04-11 2003.
  • Chen, Xuyuan; Johansen, Jarle Andre; Liu, C. L.. Temperature dependence of low-frequency electrical noise and reliability of semiconductor lasers. Semiconductor Optoelectronic Device Manufacturing and Applications 2001-11-07 - 2001-11-09 2001.
  • Johansen, Jarle Andre; Figenschau, Hallvar; Chen, Xuyuan; Van Rheenen, Arthur D.; Salm, Cora. Low Frequency Noise in Poly-Si- and Poly-SiGe-gated MOSFETs. 16'th International Conference on Noise in Physical Systems and 1/f Fluctuations 2001-10-22 - 2001-10-25 2001.
  • Chen, Xuyuan; Johansen, Jarle Andre; Salm, Cora; Van Rheenen, Arthur D.. On Low-Frequency Noise Of Polycrystalline GeSi For Sub-Micron CMOS Technologies. International Conference on Communications Computers & Devices 2000-12-14 - 2000-12-16 2000.
  • Johansen, Jarle Andre; Chen, Xuyuan; Van Rheenen, Arthur D.. Study of low-frequency noise in polycrystaline GexSi1-x.. Fysikermøtet 2000 2000-06-16 - 2000-06-18 2000.
  • Chen, Xuyuan; Johansen, Jarle Andre; Van Rheenen, Arthur D.; Salm, Cora. On the 1/f noise of polycrystalline GexSi1-x for sub-micron CMOS technologies. International conf. On Communications, Computers & Devices 2000-12-14 - 2000-12-16 2000.



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